Multifunctional Tungsten Filament Scanning Electron Microscope

Multifunctional Tungsten Filament Scanning Electron Microscope utilizes a tungsten filament electron gun that offers high emission current, excellent stability, and low vacuum requirements. The benchtop design eliminates the need for extensive space to accommodate the entire microscope system, allowing it to fit even on a user's daily work desk, delivering real-time results right at hand. Additionally, this series of benchtop microscopes can operate effectively in confined spaces such as glove boxes, vehicle compartments, or submersibles. Even in working environments where conventional microscopes struggle, this series demonstrates outstanding performance thanks to its anti-vibration and anti-magnetic technology.

Product Features

1) Compact design that is not constrained by site dimensions, offering true spatial adaptability. Users can even place it conveniently on their desktops. The CEM3000 can also be easily relocated as needed, making it versatile for multiple locations;

2) High resolution enables observation and analysis of micro-scale features, meeting users' observation needs;

3) Rapid gas pumping and venting, thanks to the vacuum system design, reduces waiting time for users;

4) High usability allows for quick imaging and one-click image capture. With automatic adjustment functions, users can obtain high-quality images without extensive manual operation;

5) Large sample chamber: The CEM3000A maintains a compact exterior while offering a chamber size comparable to upright microscopes, accommodating larger samples;

6) Excellent anti-vibration and anti-magnetic performance: The entire series boasts strong anti-interference capabilities. The CEM3000B, in particular, utilizes proprietary technology and composite anti-vibration methods to elevate the microscope's vibration resistance to new heights;

7) Optional low vacuum mode allows users to set the vacuum level in the sample chamber as needed for observing different types of samples;

8) Provides multiple imaging parameters for users to choose from, catering to the adjustment needs of professional users;

9) Multifunctional Tungsten Filament Scanning Electron Microscope is equipped with various probes, enabling multi-method analysis of samples.

Application Fields

Materials Science: Microstructural analysis of nanomaterials (e.g., 60nm silver wires), high-entropy alloy powders, zinc oxide, etc.

New Energy: Defect detection in solar panels, coating performance evaluation.

Biomedical: Surface morphology observation of microfluidic chips, drug carrier research.

Industrial Quality Inspection: Solder ball welding quality, surface roughness detection of precision components.

The Multifunctional Tungsten Filament Scanning Electron Microscope simplifies the complex usage process of scanning electron microscopes with its user-friendly operating system. Features like one-click sample loading, automatic navigation, and one-click imaging (auto-focus + auto-astigmatism correction + auto-brightness/contrast) enable users to obtain high-definition images in just tens of seconds, significantly improving efficiency.

Application Examples

Metal Material Analysis

Pollen Microstructure

Model Selection

(Large Sample Chamber Type): 70mm×70mm sample chamber, compatible with large-sized or multiple samples for batch analysis.

(Anti-Vibration Type): Designed for vibrating environments, featuring faster pumping (low vacuum in just 40 seconds) and more stable imaging.

Please note: Due to market developments and product development needs, the content in this product documentation may be updated or modified at any time without prior notice. We appreciate your understanding.

For any questions or further details, please feel free to contact Chotest Instruments for consultation.